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Journal: Sensors, 2022
Volume: 22
Number: 5408
Article:
Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference
Authors:
by
Monika E. Heringhaus, Yi Zhang, André Zimmermann and Lars Mikelsons
Link:
https://www.mdpi.com/1424-8220/22/14/5408
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