Article Versions Notes

Choi Y, Han C, Shin J, Moon S, Min J, Park H, Eom D, Lee J, Shin C. Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr:HfO₂ Ferroelectric Capacitor. Sensors. 2022; 22(11):4087. https://doi.org/10.3390/s22114087

Choi, Yejoo, Changwoo Han, Jaemin Shin, Seungjun Moon, Jinhong Min, Hyeonjung Park, Deokjoon Eom, Jehoon Lee, and Changhwan Shin. 2022. "Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr:HfO₂ Ferroelectric Capacitor" Sensors 22, no. 11: 4087. https://doi.org/10.3390/s22114087

Choi, Y., Han, C., Shin, J., Moon, S., Min, J., Park, H., Eom, D., Lee, J., & Shin, C. (2022). Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr:HfO₂ Ferroelectric Capacitor. Sensors, 22(11), 4087. https://doi.org/10.3390/s22114087