Medeiros, A.D.d.; Silva, L.J.d.; Ribeiro, J.P.O.; Ferreira, K.C.; Rosas, J.T.F.; Santos, A.A.; Silva, C.B.d.
Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging. Sensors 2020, 20, 4319.
https://doi.org/10.3390/s20154319
AMA Style
Medeiros ADd, Silva LJd, Ribeiro JPO, Ferreira KC, Rosas JTF, Santos AA, Silva CBd.
Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging. Sensors. 2020; 20(15):4319.
https://doi.org/10.3390/s20154319
Chicago/Turabian Style
Medeiros, André Dantas de, Laércio Junio da Silva, João Paulo Oliveira Ribeiro, Kamylla Calzolari Ferreira, Jorge Tadeu Fim Rosas, Abraão Almeida Santos, and ClÃssia Barboza da Silva.
2020. "Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging" Sensors 20, no. 15: 4319.
https://doi.org/10.3390/s20154319
APA Style
Medeiros, A. D. d., Silva, L. J. d., Ribeiro, J. P. O., Ferreira, K. C., Rosas, J. T. F., Santos, A. A., & Silva, C. B. d.
(2020). Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging. Sensors, 20(15), 4319.
https://doi.org/10.3390/s20154319
