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Article

Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners

Department of Construction and Manufacturing Engineering, University of Oviedo, c/Pedro Puig Adam, E.D.O.5, 33203 Gijon, Asturias, Spain
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Sensors 2020, 20(1), 1; https://doi.org/10.3390/s20010001
Received: 22 November 2019 / Revised: 12 December 2019 / Accepted: 16 December 2019 / Published: 18 December 2019
(This article belongs to the Section Optical Sensors)
Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine measurement devices capable of digitizing individual layers. Flatbed scanners should be considered as serious candidates, since they can achieve high scanning speeds at low prices. Nevertheless, image deformation phenomena reduce their suitability as two-dimensional verification devices. In this work, the possibilities of using flatbed scanners for AM contour verification are investigated. Image distortion errors are characterized and discussed and special attention is paid to the plication effect caused by contact imaging sensor (CIS) scanners. To compensate this phenomena, a new local distortion adjustment (LDA) method is proposed and its distortion correction capabilities are evaluated upon actual layer contours manufactured on a fused filament fabrication (FFF) machine. This proposed method is also compared to conventional global distortion adjustment (GDA). Results reveal quasi-systematic deformations of the images which could be minimized by means of distortion correction. Nevertheless, the irregular nature of such a distortion and the superposition of different errors penalize the use of GDA, to the point that it should not be used with CIS scanners. Conclusions indicate that LDA-based correction would enable the use of flatbed scanners in AM for on-machine verification tasks. View Full-Text
Keywords: additive manufacturing; flatbed scanner; layer contour verification additive manufacturing; flatbed scanner; layer contour verification
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MDPI and ACS Style

Blanco, D.; Fernandez, P.; Noriega, A.; Alvarez, B.J.; Valiño, G. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors 2020, 20, 1. https://doi.org/10.3390/s20010001

AMA Style

Blanco D, Fernandez P, Noriega A, Alvarez BJ, Valiño G. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors. 2020; 20(1):1. https://doi.org/10.3390/s20010001

Chicago/Turabian Style

Blanco, David, Pedro Fernandez, Alvaro Noriega, Braulio J. Alvarez, and Gonzalo Valiño. 2020. "Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners" Sensors 20, no. 1: 1. https://doi.org/10.3390/s20010001

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