Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
Blanco, D.; Fernandez, P.; Noriega, A.; Alvarez, B.J.; Valiño, G. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors 2020, 20, 1. https://doi.org/10.3390/s20010001
Blanco D, Fernandez P, Noriega A, Alvarez BJ, Valiño G. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors. 2020; 20(1):1. https://doi.org/10.3390/s20010001
Chicago/Turabian StyleBlanco, David, Pedro Fernandez, Alvaro Noriega, Braulio J. Alvarez, and Gonzalo Valiño. 2020. "Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners" Sensors 20, no. 1: 1. https://doi.org/10.3390/s20010001