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Journal: Sensors, 2019
Volume: 19
Number: 892

Article: An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer
Authors: by Artur Zarzycki, July Galeano, Sylwester Bargiel, Aurore Andrieux and Christophe Gorecki
Link: https://www.mdpi.com/1424-8220/19/4/892

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