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Journal: Sensors, 2019
Volume: 19
Number: 892
Article:
An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer
Authors:
by
Artur Zarzycki, July Galeano, Sylwester Bargiel, Aurore Andrieux and Christophe Gorecki
Link:
https://www.mdpi.com/1424-8220/19/4/892
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