Ham, S.; Han, S.-Y.; Kim, S.; Park, H.J.; Park, K.-J.; Choi, J.-H.
A Comparative Study of Fault Diagnosis for Train Door System: Traditional versus Deep Learning Approaches. Sensors 2019, 19, 5160.
https://doi.org/10.3390/s19235160
AMA Style
Ham S, Han S-Y, Kim S, Park HJ, Park K-J, Choi J-H.
A Comparative Study of Fault Diagnosis for Train Door System: Traditional versus Deep Learning Approaches. Sensors. 2019; 19(23):5160.
https://doi.org/10.3390/s19235160
Chicago/Turabian Style
Ham, Seokju, Seok-Youn Han, Seokgoo Kim, Hyung Jun Park, Kee-Jun Park, and Joo-Ho Choi.
2019. "A Comparative Study of Fault Diagnosis for Train Door System: Traditional versus Deep Learning Approaches" Sensors 19, no. 23: 5160.
https://doi.org/10.3390/s19235160
APA Style
Ham, S., Han, S.-Y., Kim, S., Park, H. J., Park, K.-J., & Choi, J.-H.
(2019). A Comparative Study of Fault Diagnosis for Train Door System: Traditional versus Deep Learning Approaches. Sensors, 19(23), 5160.
https://doi.org/10.3390/s19235160