Liu, W.; Kulin, M.; Kazaz, T.; Shahid, A.; Moerman, I.; De Poorter, E.
Wireless Technology Recognition Based on RSSI Distribution at Sub-Nyquist Sampling Rate for Constrained Devices. Sensors 2017, 17, 2081.
https://doi.org/10.3390/s17092081
AMA Style
Liu W, Kulin M, Kazaz T, Shahid A, Moerman I, De Poorter E.
Wireless Technology Recognition Based on RSSI Distribution at Sub-Nyquist Sampling Rate for Constrained Devices. Sensors. 2017; 17(9):2081.
https://doi.org/10.3390/s17092081
Chicago/Turabian Style
Liu, Wei, Merima Kulin, Tarik Kazaz, Adnan Shahid, Ingrid Moerman, and Eli De Poorter.
2017. "Wireless Technology Recognition Based on RSSI Distribution at Sub-Nyquist Sampling Rate for Constrained Devices" Sensors 17, no. 9: 2081.
https://doi.org/10.3390/s17092081
APA Style
Liu, W., Kulin, M., Kazaz, T., Shahid, A., Moerman, I., & De Poorter, E.
(2017). Wireless Technology Recognition Based on RSSI Distribution at Sub-Nyquist Sampling Rate for Constrained Devices. Sensors, 17(9), 2081.
https://doi.org/10.3390/s17092081