Order Article Reprints

Liu Z, Mei W, Zeng X, Yang C, Zhou X. Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data. Sensors. 2017; 17(11):2524. https://doi.org/10.3390/s17112524

Liu, Zhen, Wenjuan Mei, Xianping Zeng, Chenglin Yang, and Xiuyun Zhou. 2017. "Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data" Sensors 17, no. 11: 2524. https://doi.org/10.3390/s17112524

Liu, Z., Mei, W., Zeng, X., Yang, C., & Zhou, X. (2017). Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data. Sensors, 17(11), 2524. https://doi.org/10.3390/s17112524