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Journal: Sensors, 2014
Volume: 14
Number: 1295
Article:
A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects
Authors:
by
Selina S. Y. Ng, Peter W. Tse and Kwok L. Tsui
Link:
https://www.mdpi.com/1424-8220/14/1/1295
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