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Keywords = trimming techniques with fuses

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22 pages, 15981 KiB  
Article
Digital Calibration of Input Offset Voltage and Its Implementation in FDDA Circuits
by David Maljar, Michal Sovcik, Miroslav Potocny, Robert Ondica, Daniel Arbet and Viera Stopjakova
Electronics 2023, 12(22), 4615; https://doi.org/10.3390/electronics12224615 - 11 Nov 2023
Cited by 1 | Viewed by 1827
Abstract
This article deals with the calibration method of analog integrated circuits (ICs) designed in CMOS nanotechnology. A brief analysis of various methods and techniques (e.g., fuse trimming, chopper stabilization, auto-zero technique, etc.) for calibration of a specific IC’s parameter is given, leading to [...] Read more.
This article deals with the calibration method of analog integrated circuits (ICs) designed in CMOS nanotechnology. A brief analysis of various methods and techniques (e.g., fuse trimming, chopper stabilization, auto-zero technique, etc.) for calibration of a specific IC’s parameter is given, leading to motivation for this research that is focused on the digital calibration. Then, the principle and overall design of the calibration subcircuit, which was generally used to calibrate the input offset voltage VIN_OFF of the operational amplifier (OPAMP). The essence of this work is verification of the proposed digital calibration algorithm for minimization the VIN_OFF of a bulk-driven fully differential difference amplifier (FDDA) with the power supply voltage VDD = 0.4 V. Evaluation of ASIC prototyped chip samples with silicon-proved results has been done. This evaluation contains comparison of selected parameters and characteristics obtained from both simulations and measurements of non-calibrated and calibrated FDDA configurations. Full article
(This article belongs to the Special Issue Advances in RF, Analog, and Mixed Signal Circuits)
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12 pages, 3329 KiB  
Communication
A Digital Improvement—Trimming a Digital Temperature Sensor with EEPROM Reprogrammable Fuses
by Anca Mihaela Vasile (Dragan), Alina Negut, Adrian Tache and Gheorghe Brezeanu
Sensors 2021, 21(5), 1700; https://doi.org/10.3390/s21051700 - 2 Mar 2021
Cited by 4 | Viewed by 3609
Abstract
An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes [...] Read more.
An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5/−1.0 ℃ inaccuracy in the temperature range of −20 to 125 ℃ for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 ℃ and a standard deviation of 0.70 ℃ temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V. Full article
(This article belongs to the Special Issue Integrated Circuits and Systems for Smart Sensory Applications)
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