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Keywords = XUV focus characterization

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9 pages, 1812 KB  
Article
An Easy Technique for Focus Characterization and Optimization of XUV and Soft X-ray Pulses
by Alexander A. Muschet, Aitor De Andres, N. Smijesh and Laszlo Veisz
Appl. Sci. 2022, 12(11), 5652; https://doi.org/10.3390/app12115652 - 2 Jun 2022
Cited by 2 | Viewed by 3397
Abstract
For many applications of extreme ultraviolet (XUV) and X-ray pulses, a small focus size is crucial to reach the required intensity or spatial resolution. In this article, we present a simple way to characterize an XUV focus with a resolution of 1.85 µm. [...] Read more.
For many applications of extreme ultraviolet (XUV) and X-ray pulses, a small focus size is crucial to reach the required intensity or spatial resolution. In this article, we present a simple way to characterize an XUV focus with a resolution of 1.85 µm. Furthermore, this technique was applied for the measurement and optimization of the focus of an ellipsoidal mirror for photon energies ranging from 18 to 150 eV generated by high-order harmonics. We envisage a broad range of applications of this approach with sub-micrometer resolution from high-harmonic sources via synchrotrons to free-electron lasers. Full article
(This article belongs to the Section Optics and Lasers)
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