Search Results (6)

The enterprise or data center does not use the M2 SATA because of the cooling problem. Therefore, SSDs employ metal cases similar to the traditional 2.5” or 3.5” hard disk. The metal case is made of aluminum, which must be ground after the metal plate forming process. Conventionally, quality control is conducted to check the ground quality of aluminum cases manually. This method is not accurate as the data are difficult to digitize. To improve the quality control, speed, and efficiency. We established a digital imaging-based inspection system for the aluminum case grinding quality control. The inspection system consists of a digital industrial camera, a closed-circuit TV lens, a light-emitting diode (LED) light source, and a personal computer. If the loading and unloading time is ignored, the test time is less than five seconds for one case. When the tested case is uploaded to the inspection system, the camera captures and sends images to the computer. The image was processed to evaluate the quality and record the tested results. Then, the tested case is classified by a robot or an operator. Full article

This study examined the dependability of Transient Voltage Suppression (TVS) diodes under direct current (DC) switching surge stress from several manufacturers with identical electrical requirements. To prevent thermal damage, we applied a standard 3 ms DC switching surge and increased the surge voltage in increments of 0.1 V with intervals between surges. The breakdown voltage (V_BR) was measured after each DC switching surge to verify functionality. To find the maximum surge current and power level that each device could withstand before failing to clamp surge voltage at a defined V_BR level, three separate manufacturers’ TVS diode (V_BR = 6.8 V) samples were examined. There were significant variations in the computed maximum average surge current and power level between manufacturers’ samples determined by statistical analysis. Prior to failure, the average surge power was 202 W, 321 W, and 357 W, while the maximum average surge current was 29.0 A, 46.9 A, and 51.8 A, respectively. Computed 95% confidence interval ranges between manufacturers of TVS diodes revealed significant population reliability differences under DC switching surge stress. Therefore, an efficient TVS diode reliability metric for DC switching surge stress is the maximum average surge current and power immediately before device failure. Full article

As the core component of electronic equipment, vibration load has an important effect on the reliability of circuit boards. However, construction machinery has high requirements for construction efficiency and safety performance, and also has high maintenance costs. In this paper, a vibration reliability analysis and structural optimization of the control circuit board of a drilling rig are conducted. First, Failure Mode, Effects and Criticality Analysis (FMECA) and Fault Tree Analysis (FTA) qualitative and quantitative analysis were used to find the weak links in the circuit board. The quantitative and qualitative analysis results of FMECA and FTA show that the critical probability importance values of the chip inductor and TVS diode short circuit are the highest, at 0.249 and 0.173, respectively. They are up to 0.239 higher than those of the other components. Then, according to the analysis results, a precise simplified model is established for the core components, including the weak links, and modal simulations and modal tests are carried out. The key influencing parameters are obtained through comparative analysis and research on natural frequency and frequency response curves. Finally, the position of the stress–strain sensitive source in the real working environment is determined by a dynamic simulation analysis of the random vibration performance of the finite element model. The results can provide an optimization basis for an anti-vibration design of circuit boards. Full article

This work proposes a novel AlGaN/GaN transient voltage suppression (TVS) diode (B-TVS-D) with bidirectional clamp capability, which consists of a small-size AlGaN/GaN monolithic bidirectional switch, two 2DEG-based current-limiting resistors (R_1A/R_1C, in parallel connection between the gate electrodes and the neighboring ohmic-contact electrodes (anode/cathode)), and a 2DEG-based proportional amplification resistor (R₂, in parallel connection between two gate electrodes). It is demonstrated that the proposed B-TVS-D possesses a symmetrical triggering voltage (V_trig) and a high secondary breakdown current (I_s, over 8 A, corresponding to 12 kV human body model failure voltage) in different directional electrostatic discharge (ESD) events. The proposed diode can effectively enhance the electrostatic discharge robustness for the GaN-based power system. It is also verified that R_1A/R_1C and R₂ have an important impact on V_trig of the proposed B-TVS-D. Both the decrease in R₂ and increase in R_1A/R_1C can lead to the decrease of V_trig. In addition, the proposed B-TVS-D can be fabricated on the conventional p-GaN HEMT platform, making the ESD design of the GaN-based power system more convenient. Full article

The field of molecular electronics is prompted by tremendous opportunities for using a single-molecule and molecular monolayers as active components in integrated circuits. Until now, a wide range of molecular devices exhibiting characteristic functions, such as diodes, transistors, switches, and memory, have been demonstrated. However, a full understanding of the crucial factors that affect charge transport through molecular electronic junctions should yet be accomplished. Remarkably, recent advances in transition voltage spectroscopy (TVS) elucidate that it can provide key quantities for probing the transport characteristics of the junctions, including, for example, the position of the frontier molecular orbital energy relative to the electrode Fermi level and the strength of the molecule–electrode interactions. These parameters are known to be highly associated with charge transport behaviors in molecular systems and can then be used in the design of molecule-based devices with rationally tuned electronic properties. This article highlights the fundamental principle of TVS and then demonstrates its major applications to study the charge transport properties of molecular electronic junctions. Full article

In this research, we investigated the development and design of the Accelerated Life Test (ALT) and its approach to the waste of material. The development of a reliability model is based on the moment at which failure appears. The faults detected in welding joints during this research prevented proper current flow within electronic components and this interruption of current is considered a critical system failure. Minitab v18 was used to process data. Through statistical analysis, it was determined that the sample size was adequate with a 95% level of significance. A Shapiro Wilk analysis was carried out to determine the normality of the data, where a p-value of 0.1349 was obtained, which indicates that the data are normal. A Weibull analysis was applied, and it was observed that the data adjusted to the regression analysis and Weibull’s reliability distribution. The results showed that failure phenomena can occur during electronic assembly due to the values of R being too high and too close to each other. Significant issues included the welding alloy, temperature, and the interaction between the welding alloy and vibration. It is observed that with high temperature, the number of faults in the solder alloy used for tin and lead and for tin, silver, and copper were lower. 17 electronic assemblies with measures of $2\mathrm{cm}\times 2\mathrm{cm}$ were fabricated, where components such as leads and electric resistance were used. The objective of analyzing this is to obtain the characteristics of the soldering alloy. Electronic components of this type are used worldwide in all types of electronic components, including: TVs, cell phones, tablet, computers, resistors, diodes, LEDs, and capacitors. For this work, the components were built based on an LED and a diode. Full article