Electronics | Highly Cited Papers in 2023 in the Section “Semiconductor Devices”
The Section “Semiconductor Devices” of Electronics (ISSN: 2079-9292) publishes original and significant contributions to the theory and performance of semiconductor devices and related materials, including devices, fabrication processes, simulation, quantum devices, hybrid devices, flexible electronic devices, novel semiconductors, semiconductor materials, and device physics. Reviews on these subjects and Special Issues dealing with specific topics are regularly published.
As they are published in the open access format, you have free and unlimited access to all the articles published in our journal. We welcome you to read our most highly cited papers published in 2023 below:
“Recent Research for HZO-Based Ferroelectric Memory towards In-Memory Computing Applications”
by Jaewook Yoo, Hyeonjun Song, Hongseung Lee, Seongbin Lim, Soyeon Kim, Keun Heo and Hagyoul Bae
Electronics 2023, 12(10), 2297; https://doi.org/10.3390/electronics12102297
Full text available online: http://www.mdpi.com/2079-9292/12/10/2297
“Temporary Bonding and Debonding in Advanced Packaging: Recent Progress and Applications”
by Zihao Mo, Fangcheng Wang, Jinhui Li, Qiang Liu, Guoping Zhang, Weimin Li, Chunlei Yang and Rong Sun
Electronics 2023, 12(7), 1666; https://doi.org/10.3390/electronics12071666
Full text available online: https://www.mdpi.com/2079-9292/12/7/1666
“Resistive Switching Characteristic of Cu Electrode-Based RRAM Device”
by Huanmei Yuan, Tianqing Wan and Hao Bai
Electronics 2023, 12(6), 1471; https://doi.org/10.3390/electronics12061471
Full text available online: https://www.mdpi.com/2079-9292/12/6/1471
“An Improved Structure Enabling Hole Erase Operation When Using an IGZO Channel in a 3D NAND Flash Structure to Which COP (Cell-On-Peri) Structure Is Applied”
by Seonjun Choi, Myounggon Kang and Yun-Heub Song
Electronics 2023, 12(13), 2945; https://doi.org/10.3390/electronics12132945
Full text available online: https://www.mdpi.com/2079-9292/12/13/2945
“Paralleling of IGBT Power Semiconductor Devices and Reliability Issues”
by Ravi Nath Tripathi and Ichiro Omura
Electronics 2023, 12(18), 3826; https://doi.org/10.3390/electronics12183826
Full text available online: https://www.mdpi.com/2079-9292/12/18/3826