Lee, E.K.; Huh, H.; Kim, W.Y.; Lee, H.; Yoo, H.
Validity of the Simplified Computerized Comprehensive Learning Ability Screening Test for the Early Detection of Learning Disabilities. Psychiatry Int. 2025, 6, 60.
https://doi.org/10.3390/psychiatryint6020060
AMA Style
Lee EK, Huh H, Kim WY, Lee H, Yoo H.
Validity of the Simplified Computerized Comprehensive Learning Ability Screening Test for the Early Detection of Learning Disabilities. Psychiatry International. 2025; 6(2):60.
https://doi.org/10.3390/psychiatryint6020060
Chicago/Turabian Style
Lee, Eun Kyoung, Hannah Huh, Woo Young Kim, Hyunju Lee, and Hanik Yoo.
2025. "Validity of the Simplified Computerized Comprehensive Learning Ability Screening Test for the Early Detection of Learning Disabilities" Psychiatry International 6, no. 2: 60.
https://doi.org/10.3390/psychiatryint6020060
APA Style
Lee, E. K., Huh, H., Kim, W. Y., Lee, H., & Yoo, H.
(2025). Validity of the Simplified Computerized Comprehensive Learning Ability Screening Test for the Early Detection of Learning Disabilities. Psychiatry International, 6(2), 60.
https://doi.org/10.3390/psychiatryint6020060