Politano, G.G.; Castriota, M.; Santo, M.P.D.; Pipita, M.M.; Desiderio, G.; Vena, C.; Versace, C.
Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films. Mater. Proc. 2021, 4, 86.
https://doi.org/10.3390/IOCN2020-07978
AMA Style
Politano GG, Castriota M, Santo MPD, Pipita MM, Desiderio G, Vena C, Versace C.
Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films. Materials Proceedings. 2021; 4(1):86.
https://doi.org/10.3390/IOCN2020-07978
Chicago/Turabian Style
Politano, Grazia Giuseppina, Marco Castriota, Maria Penelope De Santo, Mario Michele Pipita, Giovanni Desiderio, Carlo Vena, and Carlo Versace.
2021. "Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films" Materials Proceedings 4, no. 1: 86.
https://doi.org/10.3390/IOCN2020-07978
APA Style
Politano, G. G., Castriota, M., Santo, M. P. D., Pipita, M. M., Desiderio, G., Vena, C., & Versace, C.
(2021). Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films. Materials Proceedings, 4(1), 86.
https://doi.org/10.3390/IOCN2020-07978