Next Article in Journal
Effect of PEG-Polycation Chain Flexibility on siRNA Loaded Polyion Complex Micelles Assembly and Performance
Previous Article in Journal
Micromagnetic Simulations of Magnetic Particles Embedded in Magnetic or Non-Magnetic Matrices
 
 
Abstract

Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films †

1
Dipartimento di Fisica, Università della Calabria, 87036 Rende CS, Italy
2
Licryl CNR/Nanotec c/o Dipartimento di Fisica, Università della Calabria, 87036 Rende CS, Italy
3
Notredame s.r.l., c/o Dipartimento di Fisica, Università della Calabria, 87036 Rende, Italy
*
Author to whom correspondence should be addressed.
Presented at the 2nd International Online-Conference on Nanomaterials, 15–30 November 2020; Available online: https://iocn2020.sciforum.net/.
Academic Editors: Ana María Díez-Pascual, Antonio Di Bartolomeo and Guanying Chen
Mater. Proc. 2021, 4(1), 86; https://doi.org/10.3390/IOCN2020-07978
Published: 12 November 2020
(This article belongs to the Proceedings of The 2nd International Online-Conference on Nanomaterials)
In the field of Transition Metal Dichalcogenides (TMDCs), molybdenum disulfide (MoS2) has attracted an outstanding interest due to it having several applications. MoS2 has potentialities not yet fully realized in solution-based applications. However, the lack of knowledge of the optical properties of MoS2, especially in the infrared range, has significantly limited its use in many exciting photonic fields. In this work, the broadband optical properties of MoS2 films deposited by spin-coating onto Si/SiO2 substrates were studied by means of Variable Angle Spectroscopic Ellipsometry (VASE). The morphological and the structural properties of the samples were investigated by Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Micro-Raman Spectroscopy. Micro-Raman spectroscopy measurements reveal the presence of 2H-MoS2 and 1T-MoS2 phases. The optical properties of the films show a mid-gap state at 0.6 eV, not reported in an ellipsometry work before, induced by defects in the MoS2 samples. View Full-Text
MDPI and ACS Style

Politano, G.G.; Castriota, M.; Santo, M.P.D.; Pipita, M.M.; Desiderio, G.; Vena, C.; Versace, C. Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films. Mater. Proc. 2021, 4, 86. https://doi.org/10.3390/IOCN2020-07978

AMA Style

Politano GG, Castriota M, Santo MPD, Pipita MM, Desiderio G, Vena C, Versace C. Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films. Materials Proceedings. 2021; 4(1):86. https://doi.org/10.3390/IOCN2020-07978

Chicago/Turabian Style

Politano, Grazia Giuseppina, Marco Castriota, Maria Penelope De Santo, Mario Michele Pipita, Giovanni Desiderio, Carlo Vena, and Carlo Versace. 2021. "Variable Angle Spectroscopic Ellipsometry Characterization of Spin-Coated MoS2 Films" Materials Proceedings 4, no. 1: 86. https://doi.org/10.3390/IOCN2020-07978

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop