UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors †
1. Introduction
2. Materials and Methods
3. Discussion
3.1. Spectral Dependency of UV Caused Degradation
3.2. Exceptional High UVC Response
4. Patents
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
- Yampolsky, M.; Pikhay, E.; Roizin, Y. Embedded UV Sensors in CMOS SOI Technology. Sensors 2022, 22, 712. [Google Scholar] [CrossRef] [PubMed]
- Education in Microscopy and Digital Imaging. Available online: https://zeiss.magnet.fsu.edu/articles/lightsources/mercuryarc.html (accessed on 1 March 2023).
- Gäbler, D.; Henkel, C.; Thiele, S. CMOS integrated UV-Photodiodes. 30th EUROSENSORS. Procedia Eng. 2016, 168, 1208–1213. [Google Scholar] [CrossRef]
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Gäbler, D.; Siles, P.F. UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors. Proceedings 2024, 97, 230. https://doi.org/10.3390/proceedings2024097230
Gäbler D, Siles PF. UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors. Proceedings. 2024; 97(1):230. https://doi.org/10.3390/proceedings2024097230
Chicago/Turabian StyleGäbler, Daniel, and Pablo F. Siles. 2024. "UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors" Proceedings 97, no. 1: 230. https://doi.org/10.3390/proceedings2024097230
APA StyleGäbler, D., & Siles, P. F. (2024). UV Light-Induced Response Degradation Characteristics of Silicon-Based Detectors. Proceedings, 97(1), 230. https://doi.org/10.3390/proceedings2024097230