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Journal: Proceedings, 2017
Volume: 1
Number: 375
375
Article: Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation
Authors: by Gerry Hamdana, Tony Granz, Maik Bertke, Zhi Li, Prabowo Puranto, Uwe Brand, Hutomo Suryo Wasisto and Erwin Peiner
Link: https://www.mdpi.com/2504-3900/1/4/375

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