Hamdana, G.; Granz, T.; Bertke, M.; Li, Z.; Puranto, P.; Brand, U.; Wasisto, H.S.; Peiner, E.
Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation. Proceedings 2017, 1, 375.
https://doi.org/10.3390/proceedings1040375
AMA Style
Hamdana G, Granz T, Bertke M, Li Z, Puranto P, Brand U, Wasisto HS, Peiner E.
Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation. Proceedings. 2017; 1(4):375.
https://doi.org/10.3390/proceedings1040375
Chicago/Turabian Style
Hamdana, Gerry, Tony Granz, Maik Bertke, Zhi Li, Prabowo Puranto, Uwe Brand, Hutomo Suryo Wasisto, and Erwin Peiner.
2017. "Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation" Proceedings 1, no. 4: 375.
https://doi.org/10.3390/proceedings1040375
APA Style
Hamdana, G., Granz, T., Bertke, M., Li, Z., Puranto, P., Brand, U., Wasisto, H. S., & Peiner, E.
(2017). Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation. Proceedings, 1(4), 375.
https://doi.org/10.3390/proceedings1040375
