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Open AccessFeature PaperArticle

Custom Scrubbing for Robust Configuration Hardening in Xilinx FPGAs

1
Università degli Studi di Napoli “Federico II” and INFN Sezione di Napoli, I-80126 Napoli, Italy
2
INFN Laboratori Nazionali del Sud, I-95125 Catania, Italy
*
Author to whom correspondence should be addressed.
Instruments 2019, 3(4), 56; https://doi.org/10.3390/instruments3040056
Received: 19 September 2019 / Revised: 10 October 2019 / Accepted: 11 October 2019 / Published: 14 October 2019
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly limited by the sensitivity of these devices to radiation-induced upsets in their configuration. These effects may alter the functionality until the next reconfiguration of the device. In this work, we present the radiation testing of a high-speed serial link hardened by a new, custom scrubber designed for Xilinx FPGAs. We compared the performance of our scrubber to the Xilinx Single Event Mitigation (SEM) controller and we measured the impact of the scrubbers on the reliability of the link. Our results show that our scrubber may improve reliability up to 23 times over the SEM. View Full-Text
Keywords: radiation effects; single event effects; single event upsets; multiple bit upsets; soft errors; FPGA; radiation testing; proton radiation effects; single event effects; single event upsets; multiple bit upsets; soft errors; FPGA; radiation testing; proton
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Giordano, R.; Barbieri, D.; Perrella, S.; Catalano, R. Custom Scrubbing for Robust Configuration Hardening in Xilinx FPGAs. Instruments 2019, 3, 56.

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