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Journal: Mathematics, 2023
Volume: 11
Number: 3283

Article: Long-Term Lifetime Prediction of Power MOSFET Devices Based on LSTM and GRU Algorithms
Authors: by Mesfin Seid Ibrahim, Waseem Abbas, Muhammad Waseem, Chang Lu, Hiu Hung Lee, Jiajie Fan and Ka-Hong Loo
Link: https://www.mdpi.com/2227-7390/11/15/3283

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