Wang, X.; Xie, Z.; Yan, F.; Wang, J.; Fan, J.; Zeng, Z.; Lu, J.; Zhang, H.; Zeng, N.
Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics 2025, 14, 1613.
https://doi.org/10.3390/electronics14081613
AMA Style
Wang X, Xie Z, Yan F, Wang J, Fan J, Zeng Z, Lu J, Zhang H, Zeng N.
Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics. 2025; 14(8):1613.
https://doi.org/10.3390/electronics14081613
Chicago/Turabian Style
Wang, Xiaodong, Zhiyao Xie, Fei Yan, Jiayu Wang, Jiangtao Fan, Zhiqiang Zeng, Junwen Lu, Hangqi Zhang, and Nianfeng Zeng.
2025. "Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach" Electronics 14, no. 8: 1613.
https://doi.org/10.3390/electronics14081613
APA Style
Wang, X., Xie, Z., Yan, F., Wang, J., Fan, J., Zeng, Z., Lu, J., Zhang, H., & Zeng, N.
(2025). Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics, 14(8), 1613.
https://doi.org/10.3390/electronics14081613