Wang, X.;                     Xie, Z.;                     Yan, F.;                     Wang, J.;                     Fan, J.;                     Zeng, Z.;                     Lu, J.;                     Zhang, H.;                     Zeng, N.    
        Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics 2025, 14, 1613.
    https://doi.org/10.3390/electronics14081613
    AMA Style
    
                                Wang X,                                 Xie Z,                                 Yan F,                                 Wang J,                                 Fan J,                                 Zeng Z,                                 Lu J,                                 Zhang H,                                 Zeng N.        
                Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics. 2025; 14(8):1613.
        https://doi.org/10.3390/electronics14081613
    
    Chicago/Turabian Style
    
                                Wang, Xiaodong,                                 Zhiyao Xie,                                 Fei Yan,                                 Jiayu Wang,                                 Jiangtao Fan,                                 Zhiqiang Zeng,                                 Junwen Lu,                                 Hangqi Zhang,                                 and Nianfeng Zeng.        
                2025. "Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach" Electronics 14, no. 8: 1613.
        https://doi.org/10.3390/electronics14081613
    
    APA Style
    
                                Wang, X.,                                 Xie, Z.,                                 Yan, F.,                                 Wang, J.,                                 Fan, J.,                                 Zeng, Z.,                                 Lu, J.,                                 Zhang, H.,                                 & Zeng, N.        
        
        (2025). Towards More Accurate Industrial Anomaly Detection: A Component-Level Feature-Enhancement Approach. Electronics, 14(8), 1613.
        https://doi.org/10.3390/electronics14081613