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Journal: Electronics, 2025
Volume: 14
Number: 944
Article:
Precision Hotspot Mitigation in Wafer-Level Electroplating with Novel Auxiliary Electrode Design for Advanced Large-Scale Chip Packaging
Authors:
by
Tao Jiang, Huiyong Hu, He Wang, Qiongling Yin, Pengpeng Lin, Yongyan Wei, Yanan Xu, Yitian Wang and Feng Hong
Link:
https://www.mdpi.com/2079-9292/14/5/944
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