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Journal: Electronics, 2025
Volume: 14
Number: 3494
Article:
Impact of Grain Boundaries on Zero-Temperature Coefficient Characteristics in a 3D-Stacked Transistor
Authors:
by
Kyung Hee Kim, In Man Kang, Young Jun Yoon and Kibeom Kim
Link:
https://www.mdpi.com/2079-9292/14/17/3494
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