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Journal: Electronics, 2025
Volume: 14
Number: 2634
2634
Article: A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs
Authors: by Wei Liu, Guoqixin Huang, Yaru Ding, Chu Yan, Xinwei Yu, Liang Zhao and Yi Zhao
Link: https://www.mdpi.com/2079-9292/14/13/2634

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