Knura, R.; Skibińska, K.; Sahayaraj, S.; Marciszko-Wiąckowska, M.; Gwizdak, J.; Wojnicki, M.; Żabiński, P.; Sapeta, G.; Iwanek, S.; Socha, R.P.
Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures. Electronics 2024, 13, 554.
https://doi.org/10.3390/electronics13030554
AMA Style
Knura R, Skibińska K, Sahayaraj S, Marciszko-Wiąckowska M, Gwizdak J, Wojnicki M, Żabiński P, Sapeta G, Iwanek S, Socha RP.
Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures. Electronics. 2024; 13(3):554.
https://doi.org/10.3390/electronics13030554
Chicago/Turabian Style
Knura, Rafał, Katarzyna Skibińska, Sylvester Sahayaraj, Marianna Marciszko-Wiąckowska, Jakub Gwizdak, Marek Wojnicki, Piotr Żabiński, Grzegorz Sapeta, Sylwester Iwanek, and Robert P. Socha.
2024. "Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures" Electronics 13, no. 3: 554.
https://doi.org/10.3390/electronics13030554
APA Style
Knura, R., Skibińska, K., Sahayaraj, S., Marciszko-Wiąckowska, M., Gwizdak, J., Wojnicki, M., Żabiński, P., Sapeta, G., Iwanek, S., & Socha, R. P.
(2024). Evaluation of the Electronic Properties of Atomic Layer Deposition-Grown Ge-Doped Zinc Oxide Thin Films at Elevated Temperatures. Electronics, 13(3), 554.
https://doi.org/10.3390/electronics13030554