Kumar, Y.; Lin, M.; Paredes, C.; Li, D.; Yang, G.; Kruger, D.; Li, J.J.; Morreale, P.
A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI. Electronics 2024, 13, 4991.
https://doi.org/10.3390/electronics13244991
AMA Style
Kumar Y, Lin M, Paredes C, Li D, Yang G, Kruger D, Li JJ, Morreale P.
A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI. Electronics. 2024; 13(24):4991.
https://doi.org/10.3390/electronics13244991
Chicago/Turabian Style
Kumar, Yulia, Mengtian Lin, Christopher Paredes, Dan Li, Guohao Yang, Dov Kruger, J. Jenny Li, and Patricia Morreale.
2024. "A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI" Electronics 13, no. 24: 4991.
https://doi.org/10.3390/electronics13244991
APA Style
Kumar, Y., Lin, M., Paredes, C., Li, D., Yang, G., Kruger, D., Li, J. J., & Morreale, P.
(2024). A Comprehensive Review of AI Advancement Using testFAILS and testFAILS-2 for the Pursuit of AGI. Electronics, 13(24), 4991.
https://doi.org/10.3390/electronics13244991