Zhang, J.; Xu, C.; Ma, F.; Xiang, Z.; Wang, Y.; Niu, B.; Wu, Q.; Wang, Y.
SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers. Electronics 2024, 13, 4881.
https://doi.org/10.3390/electronics13244881
AMA Style
Zhang J, Xu C, Ma F, Xiang Z, Wang Y, Niu B, Wu Q, Wang Y.
SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers. Electronics. 2024; 13(24):4881.
https://doi.org/10.3390/electronics13244881
Chicago/Turabian Style
Zhang, Jianguo, Chuxiong Xu, Feiyue Ma, Zhonghua Xiang, Yaoping Wang, Bo Niu, Qiang Wu, and Yu Wang.
2024. "SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers" Electronics 13, no. 24: 4881.
https://doi.org/10.3390/electronics13244881
APA Style
Zhang, J., Xu, C., Ma, F., Xiang, Z., Wang, Y., Niu, B., Wu, Q., & Wang, Y.
(2024). SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers. Electronics, 13(24), 4881.
https://doi.org/10.3390/electronics13244881