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Journal: Electronics, 2024
Volume: 13
Number: 4873

Article: Siamese-RCNet: Defect Detection Model for Complex Textured Surfaces with Few Annotations
Authors: by Dandan Guo, Chunying Zhang, Guanghui Yang, Tao Xue, Jiang Ma, Lu Liu and Jing Ren
Link: https://www.mdpi.com/2079-9292/13/24/4873

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