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Journal: Electronics, 2024
Volume: 13
Number: 4118
Article:
Threshold Voltage Recovery Time Measurement Technique Post VTH Instability in Normally-Off p-Gate GaN High Electron Mobility Transistors
Authors:
by
Karthick Murukesan and Florin Udrea
Link:
https://www.mdpi.com/2079-9292/13/20/4118
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