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Journal: Electronics, 2024
Volume: 13
Number: 3798

Article: An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information
Authors: by Haorong Wu, Xiaoxiao Li, Fuchun Sun, Limin Huang, Tao Yang, Yuechao Bian and Qiurong Lv
Link: https://www.mdpi.com/2079-9292/13/19/3798

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