Wu, H.; Li, X.; Sun, F.; Huang, L.; Yang, T.; Bian, Y.; Lv, Q.
An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information. Electronics 2024, 13, 3798.
https://doi.org/10.3390/electronics13193798
AMA Style
Wu H, Li X, Sun F, Huang L, Yang T, Bian Y, Lv Q.
An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information. Electronics. 2024; 13(19):3798.
https://doi.org/10.3390/electronics13193798
Chicago/Turabian Style
Wu, Haorong, Xiaoxiao Li, Fuchun Sun, Limin Huang, Tao Yang, Yuechao Bian, and Qiurong Lv.
2024. "An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information" Electronics 13, no. 19: 3798.
https://doi.org/10.3390/electronics13193798
APA Style
Wu, H., Li, X., Sun, F., Huang, L., Yang, T., Bian, Y., & Lv, Q.
(2024). An Improved Product Defect Detection Method Combining Centroid Distance and Textural Information. Electronics, 13(19), 3798.
https://doi.org/10.3390/electronics13193798