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Journal: Electronics, 2024
Volume: 13
Number: 2109

Article: Investigation of Hydrogen Flux Influence on InGaP Layer and Device Uniformity
Authors: by Shangyu Yang, Ning Guo, Siqi Zhao, Yunkai Li, Moyu Wei, Yang Zhang and Xingfang Liu
Link: https://www.mdpi.com/2079-9292/13/11/2109

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