Order Article Reprints

Marques CM, Wrobel F, Aguiar YQ, Michez A, Saigné F, Boch J, Dilillo L, García Alía R. Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells. Electronics. 2024; 13(10):1954. https://doi.org/10.3390/electronics13101954

Marques, Cleiton M., Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, and Rubén García Alía. 2024. "Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells" Electronics 13, no. 10: 1954. https://doi.org/10.3390/electronics13101954

Marques, C. M., Wrobel, F., Aguiar, Y. Q., Michez, A., Saigné, F., Boch, J., Dilillo, L., & García Alía, R. (2024). Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells. Electronics, 13(10), 1954. https://doi.org/10.3390/electronics13101954