Detection of False Data Injection Attacks on Smart Grids Based on A-BiTG Approach
Abstract
:1. Introduction
- For the first time, an A-BiTG model is proposed for the detection of FDIAs in power grids. The A-BiTG model is able to effectively capture the diversity of local information data in power grids and enhance the model’s ability to perceive dynamic changes in the time series. Meanwhile, the model solves the common problems of gradient vanishing and explosion in neural networks and also helps the model to better capture the long-term dependencies between input information.
- Secondly, the proposed BiTCN-BiGRU parallel structure enhances the parallel processing capability of the model, enabling it to manage multiple input streams simultaneously and improving the computational speed. Furthermore, the integration of the attention layer into the BiGRU layer helps to dynamically adjust the weights of each time step in the learning process, which enhances the expressive ability of the model and improves the accuracy of the model detection.
- Finally, this study conducted experiments on the IEEE 14-bus and IEEE 118-bus datasets to evaluate the performance of the A-BiTG model. The experimental results indicate that compared to some mainstream detection models, the proposed A-BiTG model demonstrates a superior detection accuracy and precision when facing covert attacks. It also exhibits lower false positive rates, a faster convergence speed of neural networks, and better stability and robustness.
2. Related Work
3. Model Description of Power Systems
3.1. Power System State Estimation
3.2. Bad Data Detection
3.3. False Data Injection Attacks
4. A-BiTG Detection Model
4.1. Input and Output Module
4.2. BiTCN Module
4.2.1. BiTCN Module Architecture
4.2.2. BiTCN Residual Block
4.3. BiGRU Module
4.3.1. BiGRU Module Architecture
4.3.2. Attention Mechanism Module
4.4. The A-BiTG Overall Framework and Loss Function
4.5. FDIA Detection Steps Based on A-BiTG Model
- Preprocessing the measurement data from the SCADA system involves segmenting the processed time series data, dividing them into training and testing sets, and using them as input for the A-BiTG model.
- In the model training phase, the training set data are imported into the constructed A-BiTG model, and the model parameters are iteratively updated according to the set number of training epochs. The best-performing model is selectively chosen and saved.
- During the testing phase, the trained model is applied to the test set data for validation; then, computational model evaluation metrics are obtained, completing the model testing process.
5. Experimental Simulation and Result Analysis
5.1. Evaluation Metrics
5.2. Experimental Environment
5.3. Dataset Settings
5.3.1. FDIA Data Generation
5.3.2. Dataset Partitioning
5.4. Model Detection Performance Analysis
5.4.1. Comparison of Detection Performance of Different Models
5.4.2. Impact of Attack Intensity
5.4.3. Impact of Environmental Noise
6. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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Dataset | Labels | ||
---|---|---|---|
Normal Samples | FDIA Samples | Total Samples | |
Training | 5600 | 5600 | 11,200 |
Test | 2400 | 2400 | 4800 |
F1-Score | |||||
---|---|---|---|---|---|
CNN | 81.91% | 80.84% | 80.72% | 78.72% | |
TCN | 85.03% | 92.33% | 76.37% | 83.60% | |
LSTM | 91.83% | 95.10% | 87.18% | 91.42% | |
CNN-LSTM | 93.23% | 93.61% | 93.18% | 93.39% | |
A-BiTG | 96.23% | 95.47% | 97.27% | 96.37% |
F1-Score | |||||
---|---|---|---|---|---|
CNN | 80.75% | 82.55% | 78.04% | 78.68% | |
TCN | 84.60% | 88.77% | 79.17% | 83.70% | |
LSTM | 90.13% | 88.48% | 92.26% | 90.33% | |
CNN-LSTM | 92.03% | 92.77% | 91.62% | 92.19% | |
A-BiTG | 95.77% | 95.14% | 96.69% | 95.91% |
Model Methods | Total Training Time of the Models(s) | |
---|---|---|
IEEE 14 | IEEE 118 | |
CNN | 71.26 | 697.19 |
TCN | 82.18 | 842.43 |
LSTM | 89.45 | 975.78 |
CNN-LSTM | 124.37 | 1229.19 |
A-BiTG | 115.64 | 1075.69 |
Model Methods | Low Attack Intensity | Medium Attack Intensity | High Attack Intensity | ||||||
---|---|---|---|---|---|---|---|---|---|
Accuracy | Precision | Recall | Accuracy | Precision | Recall | Accuracy | Precision | Recall | |
CNN | 76.98% | 79.06% | 73.56% | 80.18% | 81.18% | 77.55% | 86.30% | 85.93% | 87.66% |
TCN | 80.51% | 82.31% | 77.80% | 84.87% | 82.42% | 88.58% | 90.73% | 88.34% | 94.42% |
LSTM | 86.87% | 86.85% | 86.85% | 89.30% | 87.60% | 91.52% | 92.87% | 90.53% | 96.17% |
CNN-LSTM | 90.93% | 90.22% | 91.29% | 91.70% | 90.02% | 94.29% | 95.03% | 94.21% | 96.23% |
A-BiTG | 94.33% | 96.96% | 91.79% | 95.77% | 96.39% | 95.32% | 97.15% | 98.84% | 96.72% |
Model Methods | Low Attack Intensity | Medium Attack Intensity | High Attack Intensity | ||||||
---|---|---|---|---|---|---|---|---|---|
Accuracy | Precision | Recall | Accuracy | Precision | Recall | Accuracy | Precision | Recall | |
CNN | 73.49% | 75.31% | 70.04% | 76.02% | 76.45% | 73.40% | 83.49% | 85.52% | 80.92% |
TCN | 79.73% | 80.64% | 77.15% | 82.10% | 79.79% | 85.91% | 88.00% | 91.35% | 83.91% |
LSTM | 82.34% | 83.75% | 79.59% | 86.30% | 82.26% | 92.52% | 91.73% | 94.86% | 88.70% |
CNN-LSTM | 87.43% | 86.90% | 88.12% | 89.53% | 90.55% | 88.25% | 93.37% | 93.51% | 93.57% |
A-BiTG | 92.67% | 90.49% | 95.33% | 94.31% | 91.87% | 96.53% | 96.42% | 98.15% | 94.82% |
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He, W.; Liu, W.; Wen, C.; Yang, Q. Detection of False Data Injection Attacks on Smart Grids Based on A-BiTG Approach. Electronics 2024, 13, 1938. https://doi.org/10.3390/electronics13101938
He W, Liu W, Wen C, Yang Q. Detection of False Data Injection Attacks on Smart Grids Based on A-BiTG Approach. Electronics. 2024; 13(10):1938. https://doi.org/10.3390/electronics13101938
Chicago/Turabian StyleHe, Wei, Weifeng Liu, Chenglin Wen, and Qingqing Yang. 2024. "Detection of False Data Injection Attacks on Smart Grids Based on A-BiTG Approach" Electronics 13, no. 10: 1938. https://doi.org/10.3390/electronics13101938
APA StyleHe, W., Liu, W., Wen, C., & Yang, Q. (2024). Detection of False Data Injection Attacks on Smart Grids Based on A-BiTG Approach. Electronics, 13(10), 1938. https://doi.org/10.3390/electronics13101938