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Journal: Electronics, 2024
Volume: 13
Number: 3
Article:
Impact of Pre-Annealed ZrO2 Interfacial Layer on the Ferroelectric Behavior of Hf0.5Zr0.5O2
Authors:
by
Xiaobo Yuan, Zongfang Liu, Jiabin Qi, Jinpan Xiao, Huikai He, Wentao Tang, Choonghyun Lee and Yi Zhao
Link:
https://www.mdpi.com/2079-9292/13/1/3
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