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Journal: Electronics, 2023
Volume: 12
Number: 1214
1214
Article: Single-Event Transient Study of 28 nm UTBB-FDSOI Technology Using Pulsed Laser Mapping
Authors: by Rui Chen, Li Chen, Sai Li, Rui Liu, Xuantian Li, Shuting Shi, Cheng Gu and Jianwei Han
Link: https://www.mdpi.com/2079-9292/12/5/1214

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