Wang, P.; Qin, J.; Li, J.; Wu, M.; Zhou, S.; Feng, L.
Device Status Evaluation Method Based on Deep Learning for PHM Scenarios. Electronics 2023, 12, 779.
https://doi.org/10.3390/electronics12030779
AMA Style
Wang P, Qin J, Li J, Wu M, Zhou S, Feng L.
Device Status Evaluation Method Based on Deep Learning for PHM Scenarios. Electronics. 2023; 12(3):779.
https://doi.org/10.3390/electronics12030779
Chicago/Turabian Style
Wang, Pengjun, Jiahao Qin, Jiucheng Li, Meng Wu, Shan Zhou, and Le Feng.
2023. "Device Status Evaluation Method Based on Deep Learning for PHM Scenarios" Electronics 12, no. 3: 779.
https://doi.org/10.3390/electronics12030779
APA Style
Wang, P., Qin, J., Li, J., Wu, M., Zhou, S., & Feng, L.
(2023). Device Status Evaluation Method Based on Deep Learning for PHM Scenarios. Electronics, 12(3), 779.
https://doi.org/10.3390/electronics12030779