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Electronics
Volume 12
Issue 22
10.3390/electronics12224649
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Journal: Electronics, 2023
Volume: 12
Number: 4649

Article: Face Recognition Bias Assessment through Quality Estimation Models
Authors: by Luis Lopez Paya, Pedro Cordoba, Angela Sanchez Perez, Javier Barrachina, Manuel Benavent-Lledo, David Mulero-Pérez and Jose Garcia-Rodriguez
Link: https://www.mdpi.com/2079-9292/12/22/4649

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