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        Journal: Electronics, 2023
        Volume: 12 
                	Number: 3617 
                
        
        Article:
        Lightweight Reconstruction Network for Surface Defect Detection Based on Texture Complexity Analysis 
        Authors: 
       	by
                    Hui Shi, Gangyan Li and Hanwei Bao        
        Link:
        https://www.mdpi.com/2079-9292/12/17/3617
        
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