Xu, B.; Zhang, Z.; Sun, A.; Guo, J.; Wang, Z.; Li, B.; Dong, J.; Jia, S.; Song, L.
T-FIM: Transparency in Federated Identity Management for Decentralized Trust and Forensics Investigation. Electronics 2023, 12, 3591.
https://doi.org/10.3390/electronics12173591
AMA Style
Xu B, Zhang Z, Sun A, Guo J, Wang Z, Li B, Dong J, Jia S, Song L.
T-FIM: Transparency in Federated Identity Management for Decentralized Trust and Forensics Investigation. Electronics. 2023; 12(17):3591.
https://doi.org/10.3390/electronics12173591
Chicago/Turabian Style
Xu, Bowen, Zhijintong Zhang, Aozhuo Sun, Juanjuan Guo, Zihan Wang, Bingyu Li, Jiankuo Dong, Shijie Jia, and Li Song.
2023. "T-FIM: Transparency in Federated Identity Management for Decentralized Trust and Forensics Investigation" Electronics 12, no. 17: 3591.
https://doi.org/10.3390/electronics12173591
APA Style
Xu, B., Zhang, Z., Sun, A., Guo, J., Wang, Z., Li, B., Dong, J., Jia, S., & Song, L.
(2023). T-FIM: Transparency in Federated Identity Management for Decentralized Trust and Forensics Investigation. Electronics, 12(17), 3591.
https://doi.org/10.3390/electronics12173591