Du, B.; Wan, F.; Lei, G.; Xu, L.; Xu, C.; Xiong, Y.
YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5. Electronics 2023, 12, 2821.
https://doi.org/10.3390/electronics12132821
AMA Style
Du B, Wan F, Lei G, Xu L, Xu C, Xiong Y.
YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5. Electronics. 2023; 12(13):2821.
https://doi.org/10.3390/electronics12132821
Chicago/Turabian Style
Du, Bowei, Fang Wan, Guangbo Lei, Li Xu, Chengzhi Xu, and Ying Xiong.
2023. "YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5" Electronics 12, no. 13: 2821.
https://doi.org/10.3390/electronics12132821
APA Style
Du, B., Wan, F., Lei, G., Xu, L., Xu, C., & Xiong, Y.
(2023). YOLO-MBBi: PCB Surface Defect Detection Method Based on Enhanced YOLOv5. Electronics, 12(13), 2821.
https://doi.org/10.3390/electronics12132821