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Journal: Electronics, 2023
Volume: 12
Number: 181
Article:
Application of Fault Overlay Method and CNN in Infrared Image of Detecting Inter-Turn Short-Circuit in Dry-Type Transformer
Authors:
by
Yen-Chih Huang, Wei-Bin Wu and Cheng-Chien Kuo
Link:
https://www.mdpi.com/2079-9292/12/1/181
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