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Journal: Electronics, 2023
Volume: 12
Number: 169
Article:
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
Authors:
by
Sarah Azimi, Corrado De Sio, Andrea Portaluri, Daniele Rizzieri, Eleonora Vacca, Luca Sterpone and David Merodio Codinachs
Link:
https://www.mdpi.com/2079-9292/12/1/169
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