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Journal: Electronics, 2022
Volume: 11
Number: 3512
Article:
Security Context Migration in MEC: Challenges and Use Cases
Authors:
by
Wojciech Niewolski, Tomasz W. Nowak, Mariusz Sepczuk, Zbigniew Kotulski, Rafal Artych, Krzysztof Bocianiak and Jean-Philippe Wary
Link:
https://www.mdpi.com/2079-9292/11/21/3512
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