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Journal: Electronics, 2021
Volume: 10
Number: 3052

Article: Investigation of Mean-Time-to-Failure Measurements from AlGaN/GaN High-Electron-Mobility Transistors Using Eyring Model
Authors: by Surajit Chakraborty and Tae-Woo Kim
Link: https://www.mdpi.com/2079-9292/10/24/3052

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