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Journal: Electronics, 2021
Volume: 10
Number: 1899
Article:
Impact of Process-Induced Variations on Negative Capacitance Junctionless Nanowire FET
Authors:
by
Yejoo Choi, Jinwoong Lee, Jaehyuk Lim, Seungjun Moon and Changhwan Shin
Link:
https://www.mdpi.com/2079-9292/10/16/1899
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