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Journal: Electronics, 2021
Volume: 10
Number: 1899

Article: Impact of Process-Induced Variations on Negative Capacitance Junctionless Nanowire FET
Authors: by Yejoo Choi, Jinwoong Lee, Jaehyuk Lim, Seungjun Moon and Changhwan Shin
Link: https://www.mdpi.com/2079-9292/10/16/1899

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