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Journal: Coatings, 2023
Volume: 13
Number: 798

Article: Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors
Authors: by Yongguang Xiao, Xianghua Da, Haize Cao, Ke Xiong, Gang Li and Minghua Tang
Link: https://www.mdpi.com/2079-6412/13/4/798

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