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Journal: Coatings, 2020
Volume: 10
Number: 504
Article:
Investigation of Conductive Mechanism of Amorphous IGO Resistive Random-Access Memory with Different Top Electrode Metal
Authors:
by
Wei-Lun Huang, Yong-Zhe Lin, Sheng-Po Chang and Shoou-Jinn Chang
Link:
https://www.mdpi.com/2079-6412/10/5/504
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