Health Monitoring of Metallic Structures with Electromechanical Impedance and Piezoelectric Sensors
Abstract
:1. Introduction
2. Theoretical Methods
2.1. Derivation of Sensitive Component
2.2. DCMI Signature Extracting Model
3. Experimental Setup
3.1. Experiments on Aluminum Plates (Specimen-1 and -2)
3.2. Experiment on the Real Aircraft Fuselage (Specimen-3)
4. Results and Discussion
4.1. Comparative Analysis of Damage In-Situ Propagation on Specimen-1
4.2. Comparative Analysis of Multi-Damage Development on Specimen-2
4.3. Comparative Analysis of Damage Growth on Fuselage (Specimen-3)
5. Conclusions
- (1)
- As long as the PZT is surface-bonded on the structures, the DCMI methodology can be used for monitoring the damage propagation on simple and complex structures, which are made of metals, metal-matrix nanomaterials and composites.
- (2)
- More obvious peaks can be extracted from the raw signatures with the use of DCMI methodology, which may have potential applications in the SHM community in the future.
- (3)
- The correlation between damages growing and signatures variation can be well quantified via combing DCMI signatures with the RMSD index.
- (4)
- The DCMI methodology can extract more sensitive signatures from measured raw signatures in a simpler way.
- (5)
- The susceptance signatures can also be used for assessing the regularity of damage changing after extracting signatures with the DCMI.
Author Contributions
Funding
Conflicts of Interest
Nomenclatures
Complex symbol | |
Angular frequency (rad/s) | |
Capacitance symbol (F) | |
Dielectric constant (F/m) | |
Radius of circular PZT (m) | |
Thickness of circular PZT (m) | |
Coupling coefficient | |
Piezoelectric strain constant (×10−12 C/N) | |
Compliance coefficient (m2/N) | |
Poisson ratio | |
Wavenumber (m−1) | |
Phase velocity (m/s) | |
Density (kg/m) | |
Mechanical loss factor | |
Dielectric loss factor | |
Variable of Bessel function | |
Mechanical impedance of PZT under short-circuited condition (Ω) | |
Mechanical impedance of host structure (Ω) | |
Symbol related to adhesive layer beneath PZT | |
Non-sensitive component in admittance model (S) | |
Sensitive component in admittance model (S) | |
Admittance (S) | |
Raw conductance in parallel measurement mode (S) | |
Raw conductance in serial measurement mode (S) | |
Raw susceptance in parallel measurement mode (S) | |
Raw susceptance in serial measurement mode (S) | |
Real part of complex capacitance (F) | |
Imaginary part of complex capacitance (F) | |
Real part of complex wavenumber (m−1) | |
Imaginary part of complex wavenumber (m−1) | |
1-order Bessel function of the first kind | |
0-order Bessel function of the first kind | |
Real part of complex fraction of Bessel function | |
Imaginary part of complex fraction of Bessel function | |
Real part of the variable in Bessel function | |
Imaginary part of the variable in Bessel function | |
Modulus of DCMI signatures | |
Real part of DCMI signatures | |
Imaginary part of DCMI signatures |
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Testing Specifications | Diameter of Drilled Hole | Damage Area Ratio (%) |
---|---|---|
D0 | — | — |
D2 | 2 mm | 5.236 × 10−3 |
D4 | 4 mm | 0.021 |
Physical Parameters | Names | Values |
---|---|---|
(10−12m2/N) | Compliance coefficient at constant electric field | 16.43 |
Mechanical loss factor | 0.025 | |
Relative permittivity | 1920 | |
δ | Dielectric loss factor | 0.01 |
d31(×10−12C/N) | Piezoelectric strain coefficient | −200 |
Poisson’s ratio | 0.32 | |
ρ (kg/m2) | Density | 7750 |
h (10−3 m) | Thickness | 0.5 |
a (10−3 m) | Radius | 4.2 |
Testing States on Specimen-2 | Number of Drilled Hole (mm) |
---|---|
ST-0 | 0 (Baseline) |
ST-1 | 1 |
ST-2 | 2 |
ST-3 | 3 |
ST-4 | 4 |
ST-5 | 5 |
ST-6 | 6 |
ST-7 | 7 |
Testing States on Fuselage | Number of Drilled Hole (mm) |
---|---|
ST-0 | 0 (Baseline) |
ST-1 | 1 |
ST-2 | 2 |
ST-3 | 3 |
ST-4 | 4 |
ST-5 | 5 |
States | Raw Signatures | DCMI Signatures | ||
---|---|---|---|---|
GP | BP | Xf | Yf | |
D2 | 0.05505 | 0.01060 | 0.07423 | 0.08133 |
D4 | 0.05700 | 0.01077 | 0.08542 | 0.08907 |
States | Raw Signatures | DCMI Signatures | ||
---|---|---|---|---|
GP | BP | Xf | Yf | |
ST-1 | 0.06008 | 0.01180 | 0.06659 | 0.06815 |
ST-2 | 0.06907 | 0.01212 | 0.07267 | 0.06965 |
ST-3 | 0.06816 | 0.01294 | 0.07942 | 0.07258 |
ST-4 | 0.07423 | 0.01287 | 0.07984 | 0.07821 |
ST-5 | 0.07747 | 0.01400 | 0.08631 | 0.08144 |
ST-6 | 0.07918 | 0.01444 | 0.09268 | 0.08319 |
ST-7 | 0.08300 | 0.01498 | 0.10221 | 0.09061 |
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Zhu, J.; Wang, Y.; Qing, X. Health Monitoring of Metallic Structures with Electromechanical Impedance and Piezoelectric Sensors. Nanomaterials 2019, 9, 1268. https://doi.org/10.3390/nano9091268
Zhu J, Wang Y, Qing X. Health Monitoring of Metallic Structures with Electromechanical Impedance and Piezoelectric Sensors. Nanomaterials. 2019; 9(9):1268. https://doi.org/10.3390/nano9091268
Chicago/Turabian StyleZhu, Jianjian, Yishou Wang, and Xinlin Qing. 2019. "Health Monitoring of Metallic Structures with Electromechanical Impedance and Piezoelectric Sensors" Nanomaterials 9, no. 9: 1268. https://doi.org/10.3390/nano9091268